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Leica S430 Scanning Electron Microscope
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Revision as of 22:52, 27 November 2013
49 bytes added
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22:52, 27 November 2013
→Scanning Electron Microscope User
Line 33:
Line 33:
* Adjust standard software settings.
* Adjust standard software settings.
* Align the aperture, and change between apertures.
* Align the aperture, and change between apertures.
+
* Vent the chamber and restart the vacuum pumps. (only if necessary)
Users possessing this certification may not:
Users possessing this certification may not:
* Use the Backscatter or EDX detectors.
* Use the Backscatter or EDX detectors.
−
* Vent the chamber.
* Open the chamber and manipulate samples.
* Open the chamber and manipulate samples.
* Adjust gun alignment.
* Adjust gun alignment.
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