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Leica S430 Scanning Electron Microscope (view source)
Revision as of 01:13, 6 September 2013
, 01:13, 6 September 2013→Certification
==Certification==
==Certification==
This is probably the most complex piece of equipment we own. As such, certification will be broken into different levels which qualify a user to perform only a limited number of tasks. Unlike other PS:One equipment where anyone certified can, in turn, certify anyone else, at present the only person who may certify others is Ryan Pierce. We anticipate we will have additional trainers in the near future.
This is probably the most complex piece of equipment we own. As such, certification will be broken into different levels which qualify a user to perform only certain specific tasks. Unlike other PS:One equipment where anyone certified can, in turn, certify anyone else, at present the only person who may certify others is Ryan Pierce. We anticipate we will have additional trainers in the future.
===Microscope User===
===Microscope User===
* Observe samples already left in the chamber.
* Observe samples already left in the chamber.
* Use the Secondary Electron detector.
* Observe their own samples if prepared and placed in the chamber by someone with Sample Preparer certification.
* Observe their own samples if prepared and placed in the chamber by someone with Sample Preparer certification.
* Adjust beam current and aperture, and change between apertures.
* Adjust standard software settings.
* Align the aperture, and change between apertures.
Users possessing this certification may not:
Users possessing this certification may not:
* Vent the chamber
* Use the Backscatter or EDX detectors.
* Open the chamber and manipulate samples
* Vent the chamber.
* Adjust gun alignment
* Open the chamber and manipulate samples.
* Adjust gun alignment.
* Open the gun assembly, change filaments, anodes, etc.
* Open the gun assembly, change filaments, anodes, etc.
* Replace apertures.
* Replace apertures.
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|Steve Finkelman
|Steve Finkelman
|Ryan Pierce
|Ryan Pierce
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===Backscatter Detector User===
Users possessing this certification may:
* Move the four quadrant backscatter detector in and out of the beam path.
* Image samples with the 4QBSD.
As the 4QBSD is currently undergoing maintenance, this certification is currently on hold. It will be rolled into the Microscope User certification and made part of that curriculum at a future date.
===EDX Detector User===
Users possessing this certification may:
* Operate the EDX detector.
* Fill the EDX detector with liquid nitrogen.
As PS:One does not have a readily accessible method for transporting liquid nitrogen, this certification is currently on hold. Donation of a large Dewar (10 liter or greater) would be of immense help to make this happen.
===Sample Preparer===
===Sample Preparer===
Users possessing this certification may:
* Mount samples on stubs.
* Use the [[Technics_Hummer_V_Sputter_Coater]] to sputter coat sample stubs.
* Vent the SEM chamber.
* Load and unload samples from the chamber.
* Pump down the SEM chamber.
This certification us currently on hold pending repair of the sputter coater and acquisition of an argon tank for the sputter coater.
===Microscope Maintainer===
===Microscope Maintainer===
