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Leica S430 Scanning Electron Microscope (view source)
Revision as of 20:20, 16 September 2013
, 20:20, 16 September 2013→Maintenance Log
! Maintainer
! Maintainer
! Description
! Description
|-
|9/12/2013
|Ryan Pierce
|Discovered that final apertures were set at 20, 50, and 100 micron. However, the spare parts that came with the SEM only had 20, 30, and 50 micron apertures. Reconfigured dialogue box to use these values and for the #2 aperture, the image become much clearer. So this appears to be a config error I corrected.
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|9/2/2013
|9/2/2013